Test Structures on MCM Active Substrate: Is it worthwhile?

Joan Oliver, Hans G. Kerkhoff. Test Structures on MCM Active Substrate: Is it worthwhile?. In 1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996. pages 126-130, IEEE Computer Society, 1996. [doi]

@inproceedings{OliverK96,
  title = {Test Structures on MCM Active Substrate: Is it worthwhile?},
  author = {Joan Oliver and Hans G. Kerkhoff},
  year = {1996},
  doi = {10.1109/EDTC.1996.494137},
  url = {http://doi.ieeecomputersociety.org/10.1109/EDTC.1996.494137},
  researchr = {https://researchr.org/publication/OliverK96},
  cites = {0},
  citedby = {0},
  pages = {126-130},
  booktitle = {1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996},
  publisher = {IEEE Computer Society},
  isbn = {0-8186-7423-7},
}