Yield Optimization by Means of Process Parameters Estimation: Comparison Between ABB and ASV Techniques

Mauro Olivieri, Mirko Scarana, Giuseppe Scotti, Alessandro Trifiletti. Yield Optimization by Means of Process Parameters Estimation: Comparison Between ABB and ASV Techniques. In Enrico Macii, Odysseas G. Koufopavlou, Vassilis Paliouras, editors, Integrated Circuit and System Design, Power and Timing Modeling, Optimization and Simulation; 14th International Workshop, PATMOS 2004, Santorini, Greece, September 15-17, 2004, Proceedings. Volume 3254 of Lecture Notes in Computer Science, pages 119-128, Springer, 2004. [doi]

@inproceedings{OlivieriSST04,
  title = {Yield Optimization by Means of Process Parameters Estimation: Comparison Between ABB and ASV Techniques},
  author = {Mauro Olivieri and Mirko Scarana and Giuseppe Scotti and Alessandro Trifiletti},
  year = {2004},
  url = {http://springerlink.metapress.com/openurl.asp?genre=article&issn=0302-9743&volume=3254&spage=119},
  tags = {optimization},
  researchr = {https://researchr.org/publication/OlivieriSST04},
  cites = {0},
  citedby = {0},
  pages = {119-128},
  booktitle = {Integrated Circuit and System Design, Power and Timing Modeling, Optimization and Simulation; 14th International Workshop, PATMOS 2004, Santorini, Greece, September 15-17, 2004, Proceedings},
  editor = {Enrico Macii and Odysseas G. Koufopavlou and Vassilis Paliouras},
  volume = {3254},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {3-540-23095-5},
}