Mauro Olivieri, Mirko Scarana, Giuseppe Scotti, Alessandro Trifiletti. Yield Optimization by Means of Process Parameters Estimation: Comparison Between ABB and ASV Techniques. In Enrico Macii, Odysseas G. Koufopavlou, Vassilis Paliouras, editors, Integrated Circuit and System Design, Power and Timing Modeling, Optimization and Simulation; 14th International Workshop, PATMOS 2004, Santorini, Greece, September 15-17, 2004, Proceedings. Volume 3254 of Lecture Notes in Computer Science, pages 119-128, Springer, 2004. [doi]
Abstract is missing.