Non-linear width scaling of ESD protection devices and link with p-well implant in BCD-processes

E. H. T. Olthof, G. J. de Raad. Non-linear width scaling of ESD protection devices and link with p-well implant in BCD-processes. Microelectronics Reliability, 48(8-9):1417-1421, 2008. [doi]

Abstract

Abstract is missing.