Martin Omaña, Daniele Rossi, F. Fuzzi, Cecilia Metra, Chandra Tirumurti, R. Galivache. Novel approach to reduce power droop during scan-based logic BIST. In 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]
@inproceedings{OmanaRFMTG13,
title = {Novel approach to reduce power droop during scan-based logic BIST},
author = {Martin Omaña and Daniele Rossi and F. Fuzzi and Cecilia Metra and Chandra Tirumurti and R. Galivache},
year = {2013},
doi = {10.1109/ETS.2013.6569375},
url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2013.6569375},
researchr = {https://researchr.org/publication/OmanaRFMTG13},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-6376-1},
}