Martin Omaña, Daniele Rossi, F. Fuzzi, Cecilia Metra, Chandra Tirumurti, R. Galivache. Novel approach to reduce power droop during scan-based logic BIST. In 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]
Abstract is missing.