A New Test Method for the Large Current Magnetic Sensors

Toshiyuki Omuro, Shigeo Nakamura Surname, Takashi Kimura, Kiyokawa Omuro. A New Test Method for the Large Current Magnetic Sensors. In IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019. pages 1-7, IEEE, 2019. [doi]

Authors

Toshiyuki Omuro

This author has not been identified. Look up 'Toshiyuki Omuro' in Google

Shigeo Nakamura Surname

This author has not been identified. Look up 'Shigeo Nakamura Surname' in Google

Takashi Kimura

This author has not been identified. Look up 'Takashi Kimura' in Google

Kiyokawa Omuro

This author has not been identified. Look up 'Kiyokawa Omuro' in Google