Meng Sang Ong, Ye Chow Kuang, Poon Shern Liam, Melanie Po-Leen Ooi. Multisine With Optimal Phase-Plane Uniformity for ADC Testing. IEEE T. Instrumentation and Measurement, 61(3):566-578, 2012. [doi]
@article{OngKLO12,
title = {Multisine With Optimal Phase-Plane Uniformity for ADC Testing},
author = {Meng Sang Ong and Ye Chow Kuang and Poon Shern Liam and Melanie Po-Leen Ooi},
year = {2012},
doi = {10.1109/TIM.2011.2169614},
url = {http://dx.doi.org/10.1109/TIM.2011.2169614},
researchr = {https://researchr.org/publication/OngKLO12},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {61},
number = {3},
pages = {566-578},
}