Goichi Ono, Yuki Mori, Michiaki Nakayama, Yusuke Kanno. A Method for Measuring of RTN by Boosting Word-Line Voltage in 6-Tr-SRAMs. IEICE Transactions, 97-C(3):215-221, 2014. [doi]
@article{OnoMNK14,
title = {A Method for Measuring of RTN by Boosting Word-Line Voltage in 6-Tr-SRAMs},
author = {Goichi Ono and Yuki Mori and Michiaki Nakayama and Yusuke Kanno},
year = {2014},
url = {http://search.ieice.org/bin/summary.php?id=e97-c_3_215},
researchr = {https://researchr.org/publication/OnoMNK14},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {97-C},
number = {3},
pages = {215-221},
}