A Method for Measuring of RTN by Boosting Word-Line Voltage in 6-Tr-SRAMs

Goichi Ono, Yuki Mori, Michiaki Nakayama, Yusuke Kanno. A Method for Measuring of RTN by Boosting Word-Line Voltage in 6-Tr-SRAMs. IEICE Transactions, 97-C(3):215-221, 2014. [doi]

Abstract

Abstract is missing.