Session 2 - Statistical modeling

Hidetoshi Onodera, Hong-Ha Vuong. Session 2 - Statistical modeling. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. IEEE, 2008. [doi]

@inproceedings{OnoderaV08,
  title = {Session 2 - Statistical modeling},
  author = {Hidetoshi Onodera and Hong-Ha Vuong},
  year = {2008},
  doi = {10.1109/CICC.2008.4672004},
  url = {http://dx.doi.org/10.1109/CICC.2008.4672004},
  researchr = {https://researchr.org/publication/OnoderaV08},
  cites = {0},
  citedby = {0},
  booktitle = {Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008},
  publisher = {IEEE},
  isbn = {978-1-4244-2018-6},
}