Chia Yee Ooi, Hideo Fujiwara. A New Scan Design Technique Based on Pre-Synthesis Thru Functions. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 163-168, IEEE, 2006. [doi]
@inproceedings{OoiF06-0,
title = {A New Scan Design Technique Based on Pre-Synthesis Thru Functions},
author = {Chia Yee Ooi and Hideo Fujiwara},
year = {2006},
doi = {10.1109/ATS.2006.261015},
url = {https://doi.org/10.1109/ATS.2006.261015},
researchr = {https://researchr.org/publication/OoiF06-0},
cites = {0},
citedby = {0},
pages = {163-168},
booktitle = {15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006},
publisher = {IEEE},
isbn = {0-7695-2628-4},
}