Amdahl Corporation Board Delay Test System

Bejoy G. Oomman, Prasad Kongara, Chittaranjan Mallipeddi. Amdahl Corporation Board Delay Test System. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 558-567, IEEE Computer Society, 1992.

@inproceedings{OommanKM92,
  title = {Amdahl Corporation Board Delay Test System},
  author = {Bejoy G. Oomman and Prasad Kongara and Chittaranjan Mallipeddi},
  year = {1992},
  tags = {testing},
  researchr = {https://researchr.org/publication/OommanKM92},
  cites = {0},
  citedby = {0},
  pages = {558-567},
  booktitle = {Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992},
  publisher = {IEEE Computer Society},
  isbn = {0-7803-0760-7},
}