Near-Field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits - researchr publication authors

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Thomas Ordas, Mathieu Lisart, Etienne Sicard, Philippe Maurine, Lionel Torres. Near-Field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits. In Lars Svensson, José Monteiro, editors, Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation, 18th International Workshop, PATMOS 2008, Lisbon, Portugal, September 10-12, 2008. Revised Selected Papers. Volume 5349 of Lecture Notes in Computer Science, pages 229-236, Springer, 2008. [doi]

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