Unpowered Opens Test with X-Ray Laminography

Stig Oresjo. Unpowered Opens Test with X-Ray Laminography. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 929, IEEE Computer Society, 1996.

@inproceedings{Oresjo96,
  title = {Unpowered Opens Test with X-Ray Laminography},
  author = {Stig Oresjo},
  year = {1996},
  tags = {testing, source-to-source, open-source},
  researchr = {https://researchr.org/publication/Oresjo96},
  cites = {0},
  citedby = {0},
  pages = {929},
  booktitle = {Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996},
  publisher = {IEEE Computer Society},
  isbn = {0-7803-3541-4},
}