Eduardo Ortega, Tyler K. Bletsch, Biresh Kumar Joardar, Jonti Talukdar, Woohyun Paik, Krishnendu Chakrabarty. Simply-Track-and-Refresh: Efficient and Scalable Rowhammer Mitigation. In IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023. pages 340-349, IEEE, 2023. [doi]
@inproceedings{OrtegaBJTPC23,
title = {Simply-Track-and-Refresh: Efficient and Scalable Rowhammer Mitigation},
author = {Eduardo Ortega and Tyler K. Bletsch and Biresh Kumar Joardar and Jonti Talukdar and Woohyun Paik and Krishnendu Chakrabarty},
year = {2023},
doi = {10.1109/ITC51656.2023.00051},
url = {https://doi.org/10.1109/ITC51656.2023.00051},
researchr = {https://researchr.org/publication/OrtegaBJTPC23},
cites = {0},
citedby = {0},
pages = {340-349},
booktitle = {IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023},
publisher = {IEEE},
isbn = {979-8-3503-4325-0},
}