O. Ortiz, Danny Bluestein, U. Kuruganti. Test-Retest Reliability of Time-Domain EEG Features to Assess Cognitive Load Using a Wireless Dry-Electrode System. In 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society, EMBC 2020, Montreal, QC, Canada, July 20-24, 2020. pages 2885-2888, IEEE, 2020. [doi]
Abstract is missing.