Measurement of Self-regulated Learning: Strategies for mapping trace data to learning processes and downstream analysis implications: 0000-0001-7672-4636

Ikenna Osakwe. Measurement of Self-regulated Learning: Strategies for mapping trace data to learning processes and downstream analysis implications: 0000-0001-7672-4636. In Proceedings of the 14th Learning Analytics and Knowledge Conference, LAK 2024, Kyoto, Japan, March 18-22, 2024. pages 563-575, ACM, 2024. [doi]

Abstract

Abstract is missing.