Kengo Oshima, Noboru Takagi, Kei Sawai, Hiroyuki Masuta, Tatsuo Motoyoshi. A Pattern Recognition Method for Scene Sketch Images Using Deep Learning and Its Evaluation. In Joint 11th International Conference on Soft Computing and Intelligent Systems and 21st International Symposium on Advanced Intelligent Systems, SCIS/ISIS 2020, Hachijo Island, Japan, December 5-8, 2020. pages 1-5, IEEE, 2020. [doi]
Abstract is missing.