Soft failures in integrated circuits as a matter of ESD events

Timm Ostermann. Soft failures in integrated circuits as a matter of ESD events. In 2018 International Conference on IC Design & Technology, ICICDT 2018, Otranto, Italy, June 4-6, 2018. pages 169-172, IEEE, 2018. [doi]

Authors

Timm Ostermann

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