Kiyoyuki Osugi, Yusuke Yokota, Yasushi Naruse. Modulation of error-related negativity under construction of internal model. In IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2022, Rome, Italy, October 26-28, 2022. pages 116-120, IEEE, 2022. [doi]
Abstract is missing.