Identifying Survival-Changing Sequential Patterns for Employee Attrition Analysis

Youssef Oubelmouh, Frédéric Fargon, Cyril De Runz, Arnaud Soulet, Cyril Veillon. Identifying Survival-Changing Sequential Patterns for Employee Attrition Analysis. In 10th IEEE International Conference on Data Science and Advanced Analytics, DSAA 2023, Thessaloniki, Greece, October 9-13, 2023. pages 1-10, IEEE, 2023. [doi]

@inproceedings{OubelmouhFRSV23,
  title = {Identifying Survival-Changing Sequential Patterns for Employee Attrition Analysis},
  author = {Youssef Oubelmouh and Frédéric Fargon and Cyril De Runz and Arnaud Soulet and Cyril Veillon},
  year = {2023},
  doi = {10.1109/DSAA60987.2023.10302498},
  url = {https://doi.org/10.1109/DSAA60987.2023.10302498},
  researchr = {https://researchr.org/publication/OubelmouhFRSV23},
  cites = {0},
  citedby = {0},
  pages = {1-10},
  booktitle = {10th IEEE International Conference on Data Science and Advanced Analytics, DSAA 2023, Thessaloniki, Greece, October 9-13, 2023},
  publisher = {IEEE},
  isbn = {979-8-3503-4503-2},
}