Youssef Oubelmouh, Frédéric Fargon, Cyril De Runz, Arnaud Soulet, Cyril Veillon. Identifying Survival-Changing Sequential Patterns for Employee Attrition Analysis. In 10th IEEE International Conference on Data Science and Advanced Analytics, DSAA 2023, Thessaloniki, Greece, October 9-13, 2023. pages 1-10, IEEE, 2023. [doi]
Abstract is missing.