Aziz Oukaira, Touati Djallel eddine, Ahmad Hassan, Mohamed Ali, Yvon Savaria, Ahmed Lakhssassi. Thermo-mechanical Analysis and Fatigue Life Prediction for Integrated Circuits (ICs). In 64th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2021, Lansing, MI, USA, August 9-11, 2021. pages 630-634, IEEE, 2021. [doi]
Abstract is missing.