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A. Oukaour, Mathieu Pouliquen, Boubekeur Tala-Ighil, H. Gualous, Eric Pigeon, Olivier Gehan, B. Boudart. Supercapacitors aging diagnosis using least square algorithm. Microelectronics Reliability, 53(9-11):1638-1642, 2013. [doi]
Abstract is missing.