Measurements of a VLSI design - researchr publication authors

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John K. Ousterhout, David M. Ungar. Measurements of a VLSI design. In James S. Crabbe, Charles E. Radke, Hillel Ofek, editors, Proceedings of the 19th Design Automation Conference, DAC '82, Las Vegas, Nevada, USA, June 14-16, 1982. pages 903-908, ACM/IEEE, 1982. [doi]

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