高层次时序电路可靠度估计方法研究进展 (Survey on Reliability Estimation Methods of Sequential Circuit in Height-level)

Chengtian Ouyang, Lili Chen, Xi Wang. 高层次时序电路可靠度估计方法研究进展 (Survey on Reliability Estimation Methods of Sequential Circuit in Height-level). 计算机科学, 44(Z11):33-38, 2017. [doi]

Authors

Chengtian Ouyang

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Lili Chen

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Xi Wang

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