Chengtian Ouyang, Lili Chen, Xi Wang. 高层次时序电路可靠度估计方法研究进展 (Survey on Reliability Estimation Methods of Sequential Circuit in Height-level). 计算机科学, 44(Z11):33-38, 2017. [doi]
@article{OuyangCW17,
title = {高层次时序电路可靠度估计方法研究进展 (Survey on Reliability Estimation Methods of Sequential Circuit in Height-level)},
author = {Chengtian Ouyang and Lili Chen and Xi Wang},
year = {2017},
url = {http://www.jsjkx.com/EN/10.11896/j.issn.1002-137X.2017.11A.006},
researchr = {https://researchr.org/publication/OuyangCW17},
cites = {0},
citedby = {0},
journal = {计算机科学},
volume = {44},
number = {Z11},
pages = {33-38},
}