A Study of BER and EVM Degradation in Digital Modulation Schemes Due to PLL Jitter and Communication-Link Noise

Mohammad Oveisi, Payam Heydari. A Study of BER and EVM Degradation in Digital Modulation Schemes Due to PLL Jitter and Communication-Link Noise. IEEE Trans. Circuits Syst. I Regul. Pap., 69(8):3402-3415, 2022. [doi]

Abstract

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