Takahide Oya, Alexandre Schmid, Tetsuya Asai, Yusuf Leblebici, Yoshihito Amemiya. On the fault tolerance of a clustered single-electron neural network for differential enhancement. IEICE Electronic Express, 2(3):76-80, 2005. [doi]
@article{OyaSALA05,
title = {On the fault tolerance of a clustered single-electron neural network for differential enhancement},
author = {Takahide Oya and Alexandre Schmid and Tetsuya Asai and Yusuf Leblebici and Yoshihito Amemiya},
year = {2005},
doi = {10.1587/elex.2.76},
url = {http://dx.doi.org/10.1587/elex.2.76},
researchr = {https://researchr.org/publication/OyaSALA05},
cites = {0},
citedby = {0},
journal = {IEICE Electronic Express},
volume = {2},
number = {3},
pages = {76-80},
}