Adeboye Stephen Oyeniran, Artjom Jasnetski, Anton Tsertov, Raimund Ubar. High-level test data generation for software-based self-test in microprocessors. In 6th Mediterranean Conference on Embedded Computing, MECO 2017, Bar, Montenegro, June 11-15, 2017. pages 1-6, IEEE, 2017. [doi]
@inproceedings{OyeniranJTU17,
title = {High-level test data generation for software-based self-test in microprocessors},
author = {Adeboye Stephen Oyeniran and Artjom Jasnetski and Anton Tsertov and Raimund Ubar},
year = {2017},
doi = {10.1109/MECO.2017.7977167},
url = {https://doi.org/10.1109/MECO.2017.7977167},
researchr = {https://researchr.org/publication/OyeniranJTU17},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {6th Mediterranean Conference on Embedded Computing, MECO 2017, Bar, Montenegro, June 11-15, 2017},
publisher = {IEEE},
isbn = {978-1-5090-6742-8},
}