Jackson Pachito, Celestino V. Martins, Jorge Semião, Marcelino Bicho Dos Santos, Isabel C. Teixeira, João Paulo Teixeira. The influence of clock-gating on NBTI-induced delay degradation. In 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012. pages 61-66, IEEE Computer Society, 2012. [doi]
Abstract is missing.