On Detecting Concurrency Defects Automatically at the Design Level

Frank Padberg, Luis M. Carril, Oliver Denninger, Martin Blersch. On Detecting Concurrency Defects Automatically at the Design Level. In 20th Asia-Pacific Software Engineering Conference, APSEC 2013, Ratchathewi, Bangkok, Thailand, December 2-5, 2013 - Volume 1. pages 263-271, IEEE, 2013. [doi]

Abstract

Abstract is missing.