Topic Model Based Multi-Label Classification

Divya Padmanabhan, Satyanath Bhat, Shirish Krishnaj Shevade, Y. Narahari. Topic Model Based Multi-Label Classification. In 28th IEEE International Conference on Tools with Artificial Intelligence, ICTAI 2016, San Jose, CA, USA, November 6-8, 2016. pages 996-1003, IEEE Computer Society, 2016. [doi]

Abstract

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