S. N. Pagliarini, Arwa Ben Dhia, Lirida Alves de Barros Naviner, Jean-François Naviner. SNaP: A novel hybrid method for circuit reliability assessment under multiple faults. Microelectronics Reliability, 53(9-11):1230-1234, 2013. [doi]
@article{PagliariniDNN13,
title = {SNaP: A novel hybrid method for circuit reliability assessment under multiple faults},
author = {S. N. Pagliarini and Arwa Ben Dhia and Lirida Alves de Barros Naviner and Jean-François Naviner},
year = {2013},
doi = {10.1016/j.microrel.2013.07.027},
url = {http://dx.doi.org/10.1016/j.microrel.2013.07.027},
researchr = {https://researchr.org/publication/PagliariniDNN13},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {53},
number = {9-11},
pages = {1230-1234},
}