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SNaP: A novel hybrid method for circuit reliability assessment under multiple faults

S. N. Pagliarini, Arwa Ben Dhia, Lirida Alves de Barros Naviner, Jean-François Naviner. SNaP: A novel hybrid method for circuit reliability assessment under multiple faults. Microelectronics Reliability, 53(9-11):1230-1234, 2013. [doi]

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