Samuel N. Pagliarini, Lirida A. B. Naviner, Jean-François Naviner. Selective hardening against multiple faults employing a net-based reliability analysis. In IEEE 11th International New Circuits and Systems Conference, NEWCAS 2013, Paris, France, June 16-19, 2013. pages 1-4, IEEE, 2013. [doi]
@inproceedings{PagliariniNN13-0,
title = {Selective hardening against multiple faults employing a net-based reliability analysis},
author = {Samuel N. Pagliarini and Lirida A. B. Naviner and Jean-François Naviner},
year = {2013},
doi = {10.1109/NEWCAS.2013.6573650},
url = {http://dx.doi.org/10.1109/NEWCAS.2013.6573650},
researchr = {https://researchr.org/publication/PagliariniNN13-0},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE 11th International New Circuits and Systems Conference, NEWCAS 2013, Paris, France, June 16-19, 2013},
publisher = {IEEE},
isbn = {978-1-4799-0618-5},
}