Samuel N. Pagliarini, Lirida A. B. Naviner, Jean-François Naviner. Selective hardening against multiple faults employing a net-based reliability analysis. In IEEE 11th International New Circuits and Systems Conference, NEWCAS 2013, Paris, France, June 16-19, 2013. pages 1-4, IEEE, 2013. [doi]
Abstract is missing.