Maximal Resilience for Reliability and Yield Enhancement in Interconnect Structure - researchr publication authors

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Chih-Yun Pai, Katherine Shu-Min Li. Maximal Resilience for Reliability and Yield Enhancement in Interconnect Structure. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 261-266, IEEE Computer Society, 2010. [doi]

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