Chih-Yun Pai, Katherine Shu-Min Li. Maximal Resilience for Reliability and Yield Enhancement in Interconnect Structure. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 261-266, IEEE Computer Society, 2010. [doi]
@inproceedings{PaiL10,
title = {Maximal Resilience for Reliability and Yield Enhancement in Interconnect Structure},
author = {Chih-Yun Pai and Katherine Shu-Min Li},
year = {2010},
doi = {10.1109/ATS.2010.53},
url = {http://dx.doi.org/10.1109/ATS.2010.53},
tags = {reliability},
researchr = {https://researchr.org/publication/PaiL10},
cites = {0},
citedby = {0},
pages = {261-266},
booktitle = {Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-4248-5},
}