Degradation rate for surface pitting in GaN HEMT - researchr publication authors

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Bruce M. Paine, Vincent T. Ng, Steve R. Polmanter, Neil T. Kubota, Carl R. Ignacio. Degradation rate for surface pitting in GaN HEMT. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 1, IEEE, 2015. [doi]

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