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Device/circuit/architecture co-design of reliable STT-MRAM

Zoha Pajouhi, Xuanyao Fong, Kaushik Roy. Device/circuit/architecture co-design of reliable STT-MRAM. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 1437-1442, ACM, 2015. [doi]

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Zoha Pajouhi

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Xuanyao Fong

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Kaushik Roy

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