Mahesh Pal, Akshay, Himanshu Rohilla, B. Charan Teja. Patch Based Land Cover Classification: A Comparison of Deep Learning, SVM and NN Classifiers. In IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2020, Waikoloa, HI, USA, September 26 - October 2, 2020. pages 1933-1936, IEEE, 2020. [doi]
Abstract is missing.