Alexander Palacio, Abraham Marquez Alcaide, Juan Jose Porras, Hugues Renaudineau, Samir Kouro. Impact of charging profiles on cumulative semiconductor damage used in EV chargers. In 50th Annual Conference of the IEEE Industrial Electronics Society, IECON 2024, Chicago, IL, USA, November 3-6, 2024. pages 1-6, IEEE, 2024. [doi]
Abstract is missing.