Time redundant parity for low-cost transient error detection

David J. Palframan, Nam Sung Kim, Mikko H. Lipasti. Time redundant parity for low-cost transient error detection. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 52-57, IEEE, 2011. [doi]

Authors

David J. Palframan

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Nam Sung Kim

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Mikko H. Lipasti

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