Pantita Palittapongarnpim, Peter Wittek, Barry C. Sanders. Robustness of learning-assisted adaptive quantum-enhanced metrology in the presence of noise. In 2017 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2017, Banff, AB, Canada, October 5-8, 2017. pages 294-299, IEEE, 2017. [doi]
Abstract is missing.