Simone Pampuri, Andrea Schirru, Cristina De Luca, Giuseppe De Nicolao. Proportional hazard model with ℓ1 Penalization applied to Predictive Maintenance in semiconductor manufacturing. In IEEE Conference on Automation Science and Engineering, CASE 2011, Trieste, Italy, Aug. 24-27, 2011. pages 250-255, IEEE, 2011. [doi]
Abstract is missing.