Renjian Pan, Xin Li 0001, Krishnendu Chakrabarty. Unsupervised Root-Cause Analysis with Transfer Learning for Integrated Systems. In 39th IEEE VLSI Test Symposium, VTS 2021, San Diego, CA, USA, April 25-28, 2021. pages 1-6, IEEE, 2021. [doi]
@inproceedings{Pan0C21,
title = {Unsupervised Root-Cause Analysis with Transfer Learning for Integrated Systems},
author = {Renjian Pan and Xin Li 0001 and Krishnendu Chakrabarty},
year = {2021},
doi = {10.1109/VTS50974.2021.9441030},
url = {https://doi.org/10.1109/VTS50974.2021.9441030},
researchr = {https://researchr.org/publication/Pan0C21},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {39th IEEE VLSI Test Symposium, VTS 2021, San Diego, CA, USA, April 25-28, 2021},
publisher = {IEEE},
isbn = {978-1-6654-1949-9},
}