Federated Hard Example Mining for Defect Detection Under Statistical Heterogeneity

Yuchen Pan, Yang Bai, Lixing Chen, Zunpu Zhang. Federated Hard Example Mining for Defect Detection Under Statistical Heterogeneity. In IEEE International Conference on Systems, Man, and Cybernetics, SMC 2025, Vienna, Austria, October 5-8, 2025. pages 7145-7150, IEEE, 2025. [doi]

Authors

Yuchen Pan

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Yang Bai

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Lixing Chen

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Zunpu Zhang

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