Yuchen Pan, Yang Bai, Lixing Chen, Zunpu Zhang. Federated Hard Example Mining for Defect Detection Under Statistical Heterogeneity. In IEEE International Conference on Systems, Man, and Cybernetics, SMC 2025, Vienna, Austria, October 5-8, 2025. pages 7145-7150, IEEE, 2025. [doi]
@inproceedings{PanBCZ25,
title = {Federated Hard Example Mining for Defect Detection Under Statistical Heterogeneity},
author = {Yuchen Pan and Yang Bai and Lixing Chen and Zunpu Zhang},
year = {2025},
doi = {10.1109/SMC58881.2025.11342467},
url = {https://doi.org/10.1109/SMC58881.2025.11342467},
researchr = {https://researchr.org/publication/PanBCZ25},
cites = {0},
citedby = {0},
pages = {7145-7150},
booktitle = {IEEE International Conference on Systems, Man, and Cybernetics, SMC 2025, Vienna, Austria, October 5-8, 2025},
publisher = {IEEE},
isbn = {979-8-3315-3358-8},
}